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[1]王海清,乔丹菊,冯军,等.石化装置安全仪表系统KooN表决结构的误跳车率定量分析[J].中国安全生产科学技术,2018,14(12):152-157.[doi:10.11731/j.issn.1673-193x.2018.12.025]
　WANG Haiqing,QIAO Danju,FENG Jun,et al.Quantitative analysis on spurious trip rate of safety instrumented system with KooN voting architectures in petrochemical plant[J].JOURNAL OF SAFETY SCIENCE AND TECHNOLOGY,2018,14(12):152-157.[doi:10.11731/j.issn.1673-193x.2018.12.025]
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石化装置安全仪表系统KooN表决结构的误跳车率定量分析
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《中国安全生产科学技术》[ISSN:1673-193X/CN:11-5335/TB]

卷:
14
期数:
2018年12期
页码:
152-157
栏目:
职业安全卫生管理与技术
出版日期:
2018-12-31

文章信息/Info

Title:
Quantitative analysis on spurious trip rate of safety instrumented system with KooN voting architectures in petrochemical plant
文章编号:
1673-193X(2018)-12-0152-06
作者:
王海清1;  乔丹菊1 ; 冯军2 ; 于芳1
（1.中国石油大学（华东） 机电工程学院，山东 青岛 266580；2.青岛中油华东院安全环保有限公司，山东 青岛 266071）
Author(s):
WANG Haiqing1;  QIAO Danju1;  FENG Jun2;  YU Fang1
(1. College of Mechanical and Electronic Engineering, China University of Petroleum, Qingdao Shandong 266580, China; 2.China Petroleum EOI Safety & Environment Protection Co., Ltd., Qingdao 266580, China)
关键词:
误跳车; 误跳车率; KooN结构; 安全仪表系统; 异型冗余设备
Keywords:
spurious trip;  spurious trip rate (STR);  KooN architectures;  safety instrumented system (SIS);  nonidentical redundant components
分类号:
X937；TQ221
DOI:
10.11731/j.issn.1673-193x.2018.12.025
文献标志码:
A
摘要:
为了更准确量化安全仪表系统的误跳车率，基于联锁回路SIF中传感器、逻辑解算器、执行机构引发误跳车的不同失效机理和模型，考虑共因失效对误跳车率的影响，提出1种更符合实际并适用于异型KooN结构的新子系统误跳车率计算模型（STR of Non-identical Redundant System，SNRS）。针对SIF回路的误跳车率计算，建立了1种分析安全联锁SIF回路误跳车率（Reliability based Spurious Trip，RST）的计算框架。研究结果表明：以某聚丙烯装置第三反应器保护系统为例，将SNRS和RST方法与目前主流的多种计算方法进行数值计算对比，验证了方法的有效性，能够有效进行定量分析。
Abstract:
In order to quantify the spurious trip rate (STR) of the safety instrumented system (SIS) more accurately, based on different failure mechanism and models of spurious trip caused by the sensors, logic solvers and final executors in the interlocking circuit SIF, a new calculation model for the spurious trip rate of subsystem (STR of Nonidentical Redundant System, SNRS) was proposed considering the influence of common cause failure on the spurious trip rate, which was more consistent with the actual situation and suitable for the nonidentical KooN architectures. Aiming at the calculation of the spurious trip rate for the SIF circuit, a calculation framework for analyzing the spurious trip rate of the safety interlocking SIF circuit (Reliability based Spurious Trip, RST) from a new perspective was established. The results showed that taking the 3rd reactor protection system of a polypropylene plant as an example, the numerical calculation results of SNRS and RST methods were compared with multiple current mainstream calculation methods, and the effectiveness of the proposed methods was verified, so the quantitative analysis could be carried out effectively.

参考文献/References:

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备注/Memo

备注/Memo:
收稿日期： 2018-04-08
基金项目： 国家重大科技专项子课题（D719-ZGSY-555）；山东省自然科学基金项目（ZR201702160283）
作者简介： 王海清，博士，教授，主要研究方向为过程安全管理PSM（HAZOP/FMEA等）、安全仪表系统SIS（LOPA/FGS等）、报警管理ASM和可靠性RAM分析等。
更新日期/Last Update: 2019-01-03